Produktbild: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

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ISBN: 1489996737
ISBN 13: 9781489996732
Verlag: Springer Verlag GmbH
Umfang: xvi, 188 S.
Erscheinungsdatum: 15.10.2014
Weitere Autoren: McConaghy, Trent/Breen, Kristopher/Dyck, Jeffrey et al
Auflage: 1/2014
Produktform: Kartoniert
Einband: Kartoniert

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.   – Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows. Describes and compares a suite of approaches and flows for PVT cornerdriven design and verification. Presents Fast PVT, a novel, confidencedriven global optimization technique for PVT corner extraction and verification that is both rapid and reliable. Presents a visuallyoriented overview of probability density functions, Monte Carlo sampling, and yield estimation. Describes a suite of methods used for 23 sigma statistical design and presents a novel sigmadriven corners flow, which is a fast, accurate, and scalable method suitable for 23 sigma design and verification. Describes and compares highsigma design and verification techniques and presents a novel technique for highsigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications. Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3s statistical and highsigma statistical design.

Artikelnummer: 7414026 Kategorie:

Beschreibung

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.

Herstellerkennzeichnung:


Springer Verlag GmbH
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69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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