Produktbild: Resonant X-Ray Scattering in Correlated Systems

Resonant X-Ray Scattering in Correlated Systems

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Springer Tracts in Modern Physics 269

ISBN: 3662571226
ISBN 13: 9783662571224
Herausgeber: Youichi Murakami/Sumio Ishihara
Verlag: Springer Verlag GmbH
Umfang: vii, 241 S., 126 s/w Illustr., 25 farbige Illustr., 241 p. 151 illus., 25 illus. in color.
Erscheinungsdatum: 07.07.2018
Auflage: 1/2017
Produktform: Kartoniert
Einband: Kartoniert

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Artikelnummer: 5447140 Kategorie:

Beschreibung

Autorenporträt

Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan. Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.

Herstellerkennzeichnung:


Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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