Scanning Probe Microscopy in Nanoscience and Nanotechnology

Lieferzeit: Lieferbar innerhalb 14 Tagen

299,59 

NanoScience and Technology

ISBN: 3662502208
ISBN 13: 9783662502204
Herausgeber: Bharat Bhushan
Verlag: Springer Verlag GmbH
Umfang: xxx, 956 S.
Erscheinungsdatum: 23.08.2016
Auflage: 1/2010
Produktform: Kartoniert
Einband: Kartoniert

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber

Artikelnummer: 2873491 Kategorie:

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E-Mail: juergen.hartmann@springer.com

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