Scanning Electron Microscopy

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299,59 

Physics of Image Formation and Microanalysis, Springer Series in Optical Sciences 45

ISBN: 3642083722
ISBN 13: 9783642083723
Autor: Reimer, Ludwig
Herausgeber: P W Hawkes
Verlag: Springer Verlag GmbH
Umfang: xiv, 529 S., 47 s/w Illustr.
Erscheinungsdatum: 01.12.2010
Auflage: 2/1998
Produktform: Kartoniert
Einband: KT

2nd edition

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Artikelnummer: 1570539 Kategorie:

Beschreibung

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Autorenporträt

InhaltsangabeElectron Optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.

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