Produktbild: Scanning Probe Microscopy

Scanning Probe Microscopy

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192,59 €

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Atomic Force Microscopy and Scanning Tunneling Microscopy, NanoScience and Technology

ISBN: 3662505576
ISBN 13: 9783662505571
Autor: Voigtländer, Bert
Verlag: Springer Verlag GmbH
Umfang: xv, 382 S., 41 s/w Illustr., 148 farbige Illustr., 382 p. 189 illus., 148 illus. in color.
Erscheinungsdatum: 13.10.2016
Auflage: 1/2015
Produktform: Kartoniert
Einband: Kartoniert

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Artikelnummer: 9930505 Kategorie:

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Springer Verlag GmbH
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E-Mail: juergen.hartmann@springer.com

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