Physical Design Automation for Through-Silicon-Via (TSV) Based 3D Integrated Circuits

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160,49 

ISBN: 1441995412
ISBN 13: 9781441995414
Autor: Lim, Sung Kyu
Verlag: Springer Verlag GmbH
Umfang: xxviii, 560 S.
Erscheinungsdatum: 25.11.2012
Auflage: 1/2012
Produktform: Gebunden/Hardback
Einband: Gebunden
Artikelnummer: 1535428 Kategorie:

Beschreibung

This book provides readers with a variety of algorithms and software tools, dedicated to the physical design of through-silicon-via (TSV) based, three-dimensional integrated circuits. It describes numerous manufacturing-ready GDSII-level layouts of TSV-based 3D ICs developed with the tools covered in the book. This book will also feature sign-off level analysis of timing, power, signal integrity, and thermal analysis for 3D IC designs. Full details of the related algorithms will be provided so that the readers will be able not only to grasp the core mechanics of the physical design tools, but also to be able to reproduce and improve upon the results themselves. This book will also offer various design-for-manufacturability (DFM), design-for-reliability (DFR), and design-for-testability (DFT) techniques that are considered critical to the physical design process.

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E-Mail: juergen.hartmann@springer.com

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