Beschreibung
In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book.
Autorenporträt
Jignesh Rathod has done M.Sc(Solid State Electronics)and M.phil(thin film technology) from S.P.University. He has been pursuing doctorate degree in thin film technology under the guidance of Prof.V.M.Pathak. He has published many papers in renowned international journals,conferences & seminars. He has also worked as faculty in Engineering colleges.
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