Beschreibung
A comprehensive guide to planning and performing in situ TEM measurements that explains the basic principles and current approaches for in situ/operando measurements of material morphology, structure and chemical changes under different kinds of stimuli. Written for practitioners, it addresses experimental limitations and shows how to overcome them, explains how work with and enhance commercially available equipment, and discusses future perspectives in the field. Throughout, the reader will find practical advice and hands-on knowledge from the author's life-long efforts in extending the boundaries of this novel technology.
Autorenporträt
Renu Sharma received a B.S. and B.Ed. in Physics and Chemistry from Panjab University, India, and M.S. and Ph.D. degrees in Solid State Chemistry from the University of Stockholm, Sweden. She is currently a NIST Emeritus Fellow after working there as a project leader from 2009 to 2019. She came to NIST from Arizona State University (ASU), where she began as a Faculty Research Associate in the Department of Chemistry and Biochemistry and the Center for Solid State Science, served as a Senior Research Scientist in the LeRoy Eyring Center for Solid State Science and as an affiliated faculty member of the School of Materials and Department of Chemical Engineering. Dr. Sharma is one of the pioneers in the development of environment cell scanning/transmission electron microscopy (E(S)TEM), combining atomic-scale resolution with dynamic chemical analysis of gas-solid reactions. She has applied this powerful technique to characterize atomic-scale mechanisms underlying the synthesis and reactivity of nanoparticles (including catalysts), nanotubes, nanowires, inorganic solids, ceramics, semiconductors, and superconductor materials. She has over 180 publications to her name.
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