Gene Tagging And Marker Analysis

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Gene tagging and Molecular Marker analysis for stem rust in wheat.

ISBN: 3847323326
ISBN 13: 9783847323327
Autor: Meena, Mintu Ram/Singh, S S
Verlag: LAP LAMBERT Academic Publishing
Umfang: 120 S.
Erscheinungsdatum: 19.05.2013
Auflage: 1/2013
Format: 0.8 x 22 x 15
Gewicht: 197 g
Produktform: Kartoniert
Einband: KT

Beschreibung

In this study, Synthetic Hexaploid lines of Wheat viz., Syn 4, Syn 55 and Syn 86 were screened for resistance against virulence stem rust pathotype 40A at Division of Genetics, IARI, New Delhi. The nature of inheritance of gene governing the resistance in these synthetic lines and their allelic relationship were studied. The gene for resistance in Syn 4 and Syn 55 was found to be same, as confirmed by the test of allelism. In Syn 86. The resistance to stem rust was governed by two genes one dominant and one recessive). The F2 population developed from a cross between Syn 4 x Agra local, was used to identify molecular marker linked to stem rust resistance gene. A total of 75 RAPDs and 35 SSR primer pair were selected covering D-Genome and B-Genome on the basis of chromosomal location of resistance gene. The SSR marker Xgwm533 was found to be linked with resistance gene at a distance of 5cM and marker Xgwm389 was co-segregating. Xgwm533 was taken from B-Genome hence, the resistance gene to be located on 3-B Genome of wheat. The use of these markers in combination with other marker could better predict the presence of gene for resistance to stem rust in breeding population.

Autorenporträt

Dr. M.R. Meena, is presently working as Scientist (Plant Breeding) at Sugarcane Breeding Institute Regional Centre, Karnal. He completed her Ph.D from Indian Agricultural Research Institute, New Delhi. His research interests are in the areas of gene tagging and mapping, molecular plant breeding and marker assisted selection.

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