Thermal Conductivity Measurements in Atomically Thin Materials and Devices

Lieferzeit: Lieferbar innerhalb 14 Tagen

64,19 

SpringerBriefs in Applied Sciences and Technology – Nanoscience and Nanotechnology

ISBN: 9811553475
ISBN 13: 9789811553479
Autor: Kasirga, T Serkan
Verlag: Springer Verlag GmbH
Umfang: xv, 50 S., 3 s/w Illustr., 21 farbige Illustr., 50 p. 24 illus., 21 illus. in color.
Erscheinungsdatum: 20.05.2020
Auflage: 1/2020
Produktform: Kartoniert
Einband: Kartoniert

Highlights the use of materials with atomically thin layers in electronics and optoelectronic devicesDiscusses the thermal performance of materials such as graphene and transition metal dichalcogenidesIntroduces readers to novel techniques for thermal measurement based on the photothermal effects

Artikelnummer: 9010879 Kategorie:

Beschreibung

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.

Autorenporträt

Dr. Kasirga completed his Ph.D. in December 2013 and right after moved to Bilkent University as an Assistant Prof. Since 2015 he has been serving as associate director of the National Nanotechnology Research Center at Bilkent University. His research interests are in the area of strongly correlated systems and 2D materials.

Herstellerkennzeichnung:


Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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