Atomic Force Microscopy Based Nanorobotics

Lieferzeit: Lieferbar innerhalb 14 Tagen

160,49 

Modelling, Simulation, Setup Building and Experiments, Springer Tracts in Advanced Robotics 71

ISBN: 3642445012
ISBN 13: 9783642445019
Verlag: Springer Verlag GmbH
Umfang: xiv, 344 S.
Erscheinungsdatum: 26.11.2014
Weitere Autoren: Xie, Hui/Onal, Cagdas/Régnier, Stéphane et al
Auflage: 1/2014
Produktform: Kartoniert
Einband: Kartoniert

This clearly-expressed, well-organized book introduces designs and prototypes of nanorobotic systems in detail, examining innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Artikelnummer: 7807336 Kategorie:

Beschreibung

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. This book aims to include all of such state-of-the-art progress in an organized, structured, and detailed manner as a reference book and also potentially a textbook in nanorobotics and any other nanoscale dynamics, systems and controls related research and education. Clearly written and well-organized, this text introduces designs and prototypes of the nanorobotic systems in detail with innovative principles of three-dimensional manipulation force microscopy and parallel imaging/manipulation force microscopy.

Herstellerkennzeichnung:


Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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