Testing Embedded System

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82,90 

ISBN: 3330331178
ISBN 13: 9783330331174
Autor: Jain, Dr Neelesh
Verlag: LAP LAMBERT Academic Publishing
Umfang: 260 S.
Erscheinungsdatum: 08.08.2019
Auflage: 1/2019
Format: 1.7 x 22 x 15
Gewicht: 405 g
Produktform: Kartoniert
Einband: KT
Artikelnummer: 7879727 Kategorie:

Beschreibung

The embedded systems world is a fast growing industry. The engineers who built the products perform the testing because they understood best how things were supposed to work. The embedded industry is changing fast and systems have become larger, more complex, and more integrated. Embedded systems have to rely on high quality hardware as well as high quality software. Therefore, both hardware and software testing are essential parts of the test approach for an embedded system. Software now makes up the larger part of the system, often replacing hardware. Systems that used to work in isolation are linked to provide integrated functionality. This cannot be produced by one brilliant individual anymore, but has to be an organized team effort. Similarly, the process of testing has become larger, more complex, and harder to control. It has led to a growing need for a method that helps to get the complex testing process under control. Testing is more than just exercising the system and checking if it behaves correctly. It also involves the planning of activities, designing test cases, managing the test infrastructure, setting up an organization, dealing with politics and much more.

Autorenporträt

Dr. Neelesh Kumar Jain, is working as a Professor and Head, Department of Computer Applications, in Sagar Institute of Research & Technology, Bhopal, He has published seven books and has published more than 15 research papers in International Conference and Journals. He is a Member of IAENG, IACSIT, CSTA and Editor of Quark Journals.

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