Strain Effect in Semiconductors

Lieferzeit: Lieferbar innerhalb 14 Tagen

160,49 

Theory and Device Applications

ISBN: 1489983155
ISBN 13: 9781489983152
Autor: Sun, Yongke/Thompson, Scott E/Nishida, Toshikazu
Verlag: Springer Verlag GmbH
Umfang: xii, 350 S.
Erscheinungsdatum: 20.11.2014
Auflage: 1/2014
Produktform: Kartoniert
Einband: Kartoniert

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also: Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals Explain strain physics relevant to logic devices as well as strainbased MEMS This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.

Artikelnummer: 7551821 Kategorie:

Beschreibung

Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.

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