Beschreibung
This book provides readers with a good overview of some of most recent advances in the field of CdTe and CdZnTe detector technology for medical imaging, industrial testing and security scanning, especially as it pertains to new applications. There will be a good mixture of general chapters in both technology and applications inthe X-ray testing. The book will have an in-depth review of the research topics from leading world specialists in the field. The conversion of the X-ray and gamma-ray signal into analogue/digital value will be covered in some chapters. Some would also provide a review of CMOS chips for CdTe and CdZnTe image sensors. This book serves as an excellent reference for people already working in the field as well as for people wishing to enter it.
Autorenporträt
Krzysztof (Kris) Iniewski is a director of development architecture and applications at Redlen Technologies Inc. in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CdZnTe detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 25+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited 75+ books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.
Herstellerkennzeichnung:
Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE
E-Mail: juergen.hartmann@springer.com
