Quantum Metrology, Imaging, and Communication

Lieferzeit: Lieferbar innerhalb 14 Tagen

160,49 

Quantum Science and Technology

ISBN: 3319835408
ISBN 13: 9783319835402
Autor: Simon, David S/Jaeger, Gregg/Sergienko, Alexander V
Verlag: Springer Verlag GmbH
Umfang: xii, 273 S., 37 s/w Illustr., 68 farbige Illustr., 273 p. 105 illus., 68 illus. in color.
Erscheinungsdatum: 04.07.2018
Auflage: 1/2017
Produktform: Kartoniert
Einband: Kartoniert

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Artikelnummer: 5447844 Kategorie:

Beschreibung

Autorenporträt

David Simon. Professor, Stonehill College, Easton MA 02357, USA  Gregg Jaeger, Professor, Boston University, Boston MA 02215, USA Alexander V. Sergienko, Boston University, Boston MA 02215, USA

Herstellerkennzeichnung:


Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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