Computational Surface and Roundness Metrology

Lieferzeit: Lieferbar innerhalb 14 Tagen

171,19 

ISBN: 1848002963
ISBN 13: 9781848002968
Autor: Muralikrishnan, Balasubramanian/Raja, Jayaraman
Verlag: Springer Verlag GmbH
Umfang: xx, 263 S., 87 s/w Illustr., 263 p. 87 illus.
Erscheinungsdatum: 26.09.2008
Auflage: 1/2008
Produktform: Gebunden/Hardback
Einband: Gebunden
Artikelnummer: 1917024 Kategorie:

Beschreibung

Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, this book describes it all (in exhaustive detail). From the graduate student of metrology to the practicing engineer on the shop floor, this book is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics.

Herstellerkennzeichnung:


Springer Verlag GmbH
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69121 Heidelberg
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E-Mail: juergen.hartmann@springer.com

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