Low-Angle Polarized Neutron and X-Ray Scattering from Magnetic Nanolayers and Nanostructures

Lieferzeit: Lieferbar innerhalb 14 Tagen

106,99 

Springer Tracts in Modern Physics 273

ISBN: 3319875019
ISBN 13: 9783319875019
Autor: Paul, Amitesh
Verlag: Springer Verlag GmbH
Umfang: xi, 143 S., 4 s/w Illustr., 55 farbige Illustr., 143 p. 59 illus., 55 illus. in color.
Erscheinungsdatum: 11.08.2018
Auflage: 1/2017
Produktform: Kartoniert
Einband: Kartoniert

This research monograph presents the latest results related to the characterization of low dimensional systems. Low-angle polarized neutron scattering and X-ray scattering at grazing incidence are used as the two main techniques to explore various physical phenomena of these systems. Special focus is put on systems like thin film transition metal and rare-earth layers, oxide heterostructures, hybrid systems, self-assembled nanostructures and self-diffusion.  Readers will gain in-depth knowledge about the usage of specular scattering and off-specular scattering techniques. Investigation of in-plane and out-of-plane structures and magnetism with vector magnetometric information is illustrated comprehensively. The book caters to a wide audience working in the field of nano-dimensional magnetic systems and the neutron and X-ray reflectometry community in particular.

Artikelnummer: 6776503 Kategorie:

Beschreibung

Provides and explains important tools for the investigation of magnetic heterostructuresComprehensively introduces the techniques of low angle neutron and X-ray scattering Presents young research with all the essentials to treat data from scattering experiments

Autorenporträt

Dr. Paul is doing research at the neutron scattering department of the Technical University Munich. His focus is on fundamental and applied research on novel nanomaterials. He received his PhD from Indore University, India and spent his early postdoc phase collaborating with Nobel laureate Peter Grünberg in Jülich, Germany. Amitesh Paul's work is addressing the fundamental details of interface magnetism, such as exchange bias, interlayer exchange coupling, magnetization reversal, anisotropic properties, as well as magneto-transport properties in layered materials and layered oxide heterostructures. His particular interest lies in layer resolved magnetization profiles and lateral magnetic correlations and domains, using polarized neutron scattering and grazing incidence x-ray and neutron scattering as the main techniques. 

Herstellerkennzeichnung:


Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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