VLSI-SoC: Design for Reliability, Security, and Low Power

Lieferzeit: Lieferbar innerhalb 14 Tagen

53,49 

23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7,2015, Revised Selected Papers, IFIP Advances in Information and Communication Technology 483

ISBN: 3319834401
ISBN 13: 9783319834405
Herausgeber: Youngsoo Shin/Chi Ying Tsui/Jae-Joon Kim et al
Verlag: Springer Verlag GmbH
Umfang: xiii, 223 S., 121 s/w Illustr., 223 p. 121 illus.
Erscheinungsdatum: 22.04.2018
Auflage: 1/2016
Produktform: Kartoniert
Einband: Kartoniert

Includes supplementary material: sn.pub/extras

Artikelnummer: 5451127 Kategorie:

Beschreibung

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

Herstellerkennzeichnung:


Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

Das könnte Ihnen auch gefallen …