Structural, Syntactic, and Statistical Pattern Recognition

Lieferzeit: Lieferbar innerhalb 14 Tagen

106,99 

Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19,2006, Proceedings, Lecture Notes in Computer Science 4109 – Image Processing, Computer Vision, Pattern Recognition, and Graphics

ISBN: 3540372369
ISBN 13: 9783540372363
Herausgeber: Dit-Yan Yeung/James T Kwok/Ana Fred et al
Verlag: Springer Verlag GmbH
Umfang: xxi, 939 S.
Erscheinungsdatum: 03.08.2006
Auflage: 1/2006
Produktform: Kartoniert
Einband: Kartoniert

Proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006 Collects 38 revised full papers and 61 revised poster papers, together with 4 invited papers Topics include image analysis, character recognition, bayesian networks, graph-based methods and more

Artikelnummer: 9724692 Kategorie:

Beschreibung

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

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