Radiation Effects on Embedded Systems

Lieferzeit: Lieferbar innerhalb 14 Tagen

160,49 

ISBN: 1402056451
ISBN 13: 9781402056451
Herausgeber: Raoul Velazco/Pascal Fouillat/Ricardo Reis
Verlag: Springer Verlag GmbH
Umfang: viii, 269 S.
Erscheinungsdatum: 04.06.2007
Auflage: 1/2007
Produktform: Gebunden/Hardback
Einband: GEB

Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

Artikelnummer: 1208734 Kategorie:

Beschreibung

Inhaltsangabe1- Space Radiation Environment, J.-C. Boudenot (THALES) 2 Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3 InFlight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4 MultiLevel Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5 Effects of Radiation on Analog & MixedSignal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSECNM) 6 Fundamentals of the Pulsed Laser Technique for SingleEvent Upset Testing, P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL) 7 Design Hardening Methodologies for ASICs, F. Faccio (CERN) 8 Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS) 9 Automatic Tools for Design Hardening, C. LopezOngill, L. Entrena, M. GraciaValderas, M. PortelaGarcia (Univ. Carlos III) 10 Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL) 11 Error Rate Prediction of Digital Architectures: Test Methodology and Tools, R. Velazco, F, Faure (TIMA) 12 Using the SEEM Software for Laser SET Testing and Analysis, V. Pouget, P. Fouillat, D. Lewis (IXL)

Autorenporträt

Inhaltsangabe1- Space Radiation Environment, J.-C. Boudenot (THALES) 2- Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3- In-Flight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4- Multi-Level Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5- Effects of Radiation on Analog & Mixed-Signal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSE-CNM) 6- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing, P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL) 7- Design Hardening Methodologies for ASICs, F. Faccio (CERN) 8- Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS) 9- Automatic Tools for Design Hardening, C. Lopez-Ongill, L. Entrena, M. Gracia-Valderas, M. Portela-Garcia (Univ. Carlos III) 10- Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL) 11- Error Rate Prediction of Digital Architectures: Test Methodology and Tools, R. Velazco, F, Faure (TIMA) 12- Using the SEEM Software for Laser SET Testing and Analysis, V. Pouget, P. Fouillat, D. Lewis (IXL)

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