Beschreibung
Inhaltsangabe1- Space Radiation Environment, J.-C. Boudenot (THALES) 2 Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3 InFlight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4 MultiLevel Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5 Effects of Radiation on Analog & MixedSignal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSECNM) 6 Fundamentals of the Pulsed Laser Technique for SingleEvent Upset Testing, P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL) 7 Design Hardening Methodologies for ASICs, F. Faccio (CERN) 8 Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS) 9 Automatic Tools for Design Hardening, C. LopezOngill, L. Entrena, M. GraciaValderas, M. PortelaGarcia (Univ. Carlos III) 10 Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL) 11 Error Rate Prediction of Digital Architectures: Test Methodology and Tools, R. Velazco, F, Faure (TIMA) 12 Using the SEEM Software for Laser SET Testing and Analysis, V. Pouget, P. Fouillat, D. Lewis (IXL)
Autorenporträt
Inhaltsangabe1- Space Radiation Environment, J.-C. Boudenot (THALES) 2- Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3- In-Flight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4- Multi-Level Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5- Effects of Radiation on Analog & Mixed-Signal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSE-CNM) 6- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing, P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL) 7- Design Hardening Methodologies for ASICs, F. Faccio (CERN) 8- Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS) 9- Automatic Tools for Design Hardening, C. Lopez-Ongill, L. Entrena, M. Gracia-Valderas, M. Portela-Garcia (Univ. Carlos III) 10- Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL) 11- Error Rate Prediction of Digital Architectures: Test Methodology and Tools, R. Velazco, F, Faure (TIMA) 12- Using the SEEM Software for Laser SET Testing and Analysis, V. Pouget, P. Fouillat, D. Lewis (IXL)