Elements of STIL

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Principles and Applications of IEEE Std. 1450 – Frontiers in Electronic Testing 24, Frontiers in Electronic Testing 24

ISBN: 1402076371
ISBN 13: 9781402076374
Autor: Maston, Gregory A/Taylor, Tony R/Villar, Julie N
Verlag: Springer Verlag GmbH
Umfang: xix, 291 S.
Erscheinungsdatum: 31.10.2003
Auflage: 1/2003
Produktform: Gebunden/Hardback
Einband: GEB

Inhaltsangabe1 Foundations of STIL.- 1.1 Introduction.- 1.2 Organization of this Book.- 1.3 History.- 1.4 Foundation Efforts.- 1.5 Scope of STIL and Follow-On Efforts.- 1.5.1 Negotiating the Scope Limits.- 1.5.2 Format or Language?.- 1.5.3 Compression and the Binary Format Discussion.- 1.5.4 Evolving Standards.- 1.6 Parallel Standards.- 2 STIL Test.- 2.1 Test Stresses.- 2.1.1 ASIC Test.- 2.1.2 Microprocessor Test.- 2.2 Test Strategies.- 2.2.1 Fault Models.- 2.2.2 Functional and Structural Testing.- 2.2.3 Single Stuck-At Fault Model.- 2.2.4 Bridging Faults Model.- 2.2.5 IDDqTesting.- 2.2.6 Delay Tests.- 2.2.7 Transition Fault Model.- 2.2.8 Path Delay Fault Model.- 2.2.9 Test Metrics.- 2.2.10 Fault Diagnosis.- 2.3 Test Behaviors.- 2.3.1 Signals.- 2.3.2 Stimulus and Response.- 2.3.3 Periodicity.- 2.3.4 Output Response Constraints.- 2.4 Test Induced Faults.- 2.4.1 Packaging Effects.- 2.4.2 Simultaneous Switching Outputs.- 2.4.3 Guardbanding.- 2.5 Other Applications of STIL.- 3 Signals.- 3.1 Signals.- 3.1.1 User Names Characteristics.- 3.1.2 Really Long User Names and Concatenation.- 3.1.3 Types of Signals.- 3.2 Signal Arrays.- 3.3 SignalGroups.- 3.3.1 SignalGroup Block Names.- 3.3.2 SignalGroup Evaluation and Name Resolution.- 3.3.3 Applications of SignalGroups.- 3.4 STIL Statement Constructs and Block Structure.- 3.4.1 Single Statements Construct.- 3.4.2 Block Statements Construct.- 3.4.3 Named Blocks.- 3.4.4 Reserving the Leading Keyword.- 3.5 Signals and SignalGroups Syntax.- 3.6 Signal and SignalGroup Attributes.- 3.7 The Test Attributes.- 3.7.1 Application of the Test Attributes.- 3.7.2 Propagation of the Test Attributes.- 3.7.3 Two Usage Models for the Test Attributes.- 3.8 WGL Signals.- 4 Timing.- 4.1 The Timing Block.- 4.2 Event Statements.- 4.2.1 States and Levels.- 4.2.2 ForceUnknown, ‚N‘.- 4.2.3 The Difference Between Compare and Expect States.- 4.2.4 The Relationship Between Drive and Compare States.- 4.3 Basic Time Expressions.- 4.4 Waveforms.- 4.4.1 Types of Waveforms.- 4.4.2 Waveform Styles.- 4.5 WaveformCharacters.- 4.6 Merging Common Waveforms.- 4.7 Event Ordering and Persistence.- 4.8 Maintaining Related Events.- 4.8.1 End-Strobe Relationships.- 4.8.2 Delayed Pulse or NRZ Waveforms.- 4.9 Special Events.- 4.9.1 Time-Zero Event.- 4.9.2 Tristate Events.- 4.10 The Rest of the Timing Block Syntax.- 4.10.1 Period Statement.- 4.10.2 Signal Reference Resolution in Timing.- 4.11 WGL Timing Constructs.- 5 Patterns.- 5.1 Fundamental Pattern Constructs.- 5.2 Statement Order Dependency.- 5.3 WaveformTable Reference Statement.- 5.4 Signal Assignment.- 5.4.1 Multiple Signal Assignment.- 5.4.2 Multiple Based Signal Assignment.- 5.4.3 Decimal Mapping.- 5.4.4 Default Attributes.- 5.4.5 WFC Expressions.- 5.4.6 Mixing Modifiers.- 5.5 Vectors.- 5.6 Conditions.- 5.7 Incremental Behavior.- 5.8 Loop Constructs.- 5.8.1 Loop Statement.- 5.8.2 MatchLoop.- 5.8.3 Other Loops.- 5.9 Labels.- 5.10 Stop and IDDQTestPoint.- 5.11 Breakpoint.- 5.12 WGL Pattern Constructs.- 6 Tying It All Together.- 6.1 Basic STIL Information Flow.- 6.2 The PatternBurst.- 6.2.1 Basic PatternBurst.- 6.2.2 Hierarchical PatternBursts.- 6.2.3 Environment/Context Statements in the PatternBurst.- 6.2.4 PatternBurst Organizations.- 6.3 The PatternExec.- 6.4 Additional STIL Constructs.- 6.4.1 STIL block.- 6.4.2 Header block.- 6.4.3 Annotations.- 6.4.4 Comments.- 6.5 STIL Block Order.- 6.6 WGL Constructs.- 7 Files and the Include Statement.- 7.1 Include Statement.- 7.1.1 Relative File Path Naming.- 7.1.2 Absolute File Path Naming.- 7.1.3 Using Logicals in the Path Name.- 7.2 The IfNeed Option.- 7.3 Additional File Constructs and Behaviors.- 8 Specifications.- 8.1 Device Operating Specifications.- 8.2 STIL Extensions to the Spec Variables.- 8.3 Spec and Category.- 8.4 Spec Variable Resolution.- 8.5 Based Expressions.- 8.6 Selector.- 8.7 Applying Spec Variables.- 8.8 More Spec Constructs.- 8.8.1 Explicit Spec Variable Type Referencing.- 8.8.2 The Spec Variable Meas Type.- 8.9 Relative Wave

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Beschreibung

Standard - Test In. terface ____________________ Language So I was wrong. I was absolutely sure that by having an IEEE Standard defined, reviewed, and accepted, that I wouldn't need to write a book about it as well. The Standard would be the complete reference. And be aware - this book does not serve as a replacement to the IEEE Std. 1450 document. You should have a copy of the Standard as you go through this book. I realized that the Standard would not be the complete reference, about the time that the Working Group started to put notes into the draft proposa- notes to elaborate decisions in the Working Group, but that would be removed in the final draft. Then, once the Standard was accepted I became the central point of contact for people who just picked up the Standard, who didn't have the benefit of the Working Group discussions, who only had available that one final sentence in the Standard and who didn't benefit from the perspective of where those words came from. Sometimes those questions have resulted in clarifications to the Standard. Sometimes I would respond to those questions with more background and perspective as well. It is this additional background and perspective I hope you find in this book.

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