Beschreibung
InhaltsangabeADC Characterisation Based on Sinewave Analysis.- ADC Applications, Architectures and Terminology.- Sinewave Test Setup.- Time-Domain Data Analysis.- Frequency-Domain Data Analysis.- Code Histogram Test.- Comparative Study of ADC Sinewave Test Methods.- Measurement of Additional Parameters.- Jitter Measurement.- Differential Gain and Phase Testing.- Step and Transient Response Measurement.- Hysteresis Measurement.
Autorenporträt
Dallet, Dominique obtained his PhD degree in Electrical Engineering in 1995 from the University of Bordeaux 1, where he is currently a professor at the Electronic Engineering School of Bordeaux (ENSEIRB). His main research activities, carried-out at the IXL laboratory, focus on mixed-signal circuit design and testing, digital and analogue signal processing, and programmable devices' applications. His interests include also digital design and its application in BIST structures for the characterization of embedded A/D converters, as well as, digital signal processing applied to nondestructive techniques based on time-frequency representation. Machado da Silva, José received the Licenciatura and PhD, both in Electrical and Computer Engineering from the Faculdade de Engenharia da Universidade do Porto (FEUP), Portugal, in 1984 and 1998, respectively. He is currently an Assistant Professor at FEUP and a project leader at Instituto de Engenharia de Sistemas e de Computadores (INESC-Porto), with teaching and research responsibilities on design and testing of electronic circuits. His research interests include analogue and mixed-signal design for testability, new testing methodologies, analogue and digital signal processing, and VLSI design.
