CMOS Multichannel Single-Chip Receivers for Multi-Gigabit Optical Data Communications

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106,99 

Analog Circuits and Signal Processing

ISBN: 9048174732
ISBN 13: 9789048174737
Autor: Muller, Paul/Leblebici, Yusuf
Verlag: Springer Verlag GmbH
Umfang: xx, 191 S.
Erscheinungsdatum: 23.11.2010
Auflage: 1/2010
Produktform: Kartoniert
Einband: Kartoniert
Artikelnummer: 1556604 Kategorie:

Beschreibung

The intention of this book is to address a number of timely, performance-critical issues within the field of short-distance optical communications, from a circuit designers perspective. It discusses the major trade-offs the designer has to deal with in the development of monolithically integrated receivers in CMOS technologies. As such, it is based on Dr. Mullers doctoral dissertation entitled A Standard CMOS Multi-Channel Single-Chip Receiver for Multi-Gigabit Optical Data Communications, subm- ted to the School of Engineering of the École Polytechnique Fédérale de Lausanne (EPFL) in May 2006. The dissertation material has been enhanced by the presentation of a number of alternative design approaches and circuit topologies, providing exhaustive coverage of the state of the art in optical sho- distance receiver circuit design. The need for a new processor input/output (I/O) interface paradigm is dictated by ongoing te- nology scaling and the advent of multi-core systems. Indeed, each new generation of microprocessors and digital signal processors provides higher computing power and data throughput, whereas the available bandwidth of the I/O interfaces is subject to much slower growth. Moving beyond - coming serial links to an optical data link paradigm for very short-distance (board-to-board and chip-- chip communications allows for considerable I/O interface bandwidth enhancement. Fully integrated silicon CMOS receivers are considered to be the technology of choice to lead this solution to economic success, because monolithic integration results in lower volume-manufacturing cost, improved yield and reduced assembly and test expenses.

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