Circuit Design for Reliability

Lieferzeit: Lieferbar innerhalb 14 Tagen

109,99 

ISBN: 1493941569
ISBN 13: 9781493941568
Herausgeber: Ricardo Reis/Yu Cao/Gilson Wirth
Verlag: Springer Verlag GmbH
Umfang: vi, 272 S., 58 s/w Illustr., 132 farbige Illustr., 272 p. 190 illus., 132 illus. in color.
Erscheinungsdatum: 22.09.2016
Auflage: 1/2015
Produktform: Kartoniert
Einband: Kartoniert

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. – Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with firstprinciple simulations.

Artikelnummer: 9630870 Kategorie:

Beschreibung

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Herstellerkennzeichnung:


Springer Verlag GmbH
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69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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