Beschreibung
This book offers readers an overview of some of the most recent advances in the field of advanced materials used for gamma and X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and GaAs, as well as perovskite crystals, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Autorenporträt
Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications. Prior to Redlen Kris hold various management and academic positions at PMC-Sierra, University of Alberta, SFU, UBC and University of Toronto. Dr. Iniewski has published over 150+ research papers in international journals and conferences. He holds 20+ international patents granted in USA, Canada, France, Germany, and Japan. He wrote and edited several books for Wiley, Cambridge University Press, Mc-Graw Hill, CRC Press and Springer. He is a frequent invited speaker and has consulted for multiple organizations internationally.
Herstellerkennzeichnung:
Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE
E-Mail: juergen.hartmann@springer.com
