X-Ray Structure Analysis

Lieferzeit: Lieferbar innerhalb 14 Tagen

74,95 

De Gruyter Textbook

ISBN: 3110610701
ISBN 13: 9783110610703
Autor: Siegrist, Theo
Verlag: De Gruyter GmbH
Umfang: X, 240 S., 16 s/w Illustr., 71 farbige Illustr., 60 s/w Tab., 16 b/w and 71 col. ill., 60 b/w tbl.
Erscheinungsdatum: 22.11.2021
Auflage: 1/2021
Gewicht: 418 g
Produktform: Kartoniert
Einband: Paperback
Artikelnummer: 2851967 Kategorie:

Beschreibung

This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed.

Autorenporträt

This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals. This is the ideal primer for students and graduates to understand the essentials of cristallography.

Herstellerkennzeichnung:


Walter de Gruyter GmbH
De Gruyter GmbH
Genthiner Strasse 13
10785 Berlin
DE

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