Beschreibung
This book discusses practical applications of reliability and statistical methods and techniques in various disciplines, using machine learning, artificial intelligence, optimization, and other computation methods. Bringing together research from international experts, each chapter aims to cover both methods and practical aspects on reliability or statistical computations with emphasis on applications. 5G and IoT are set to generate an estimated 1 billion terabytes of data by 2025 and companies continue to search for new techniques and tools that can help them practice data collection effectively in promoting their business. This book explores the era of big data through reliability and statistical computing, showcasing how almost all applications in our daily life have experienced a dramatic shift in the past two decades to a truly global industry. Including numerous illustrations and worked examples, the book is of interest to researchers, practicing engineers, and postgraduate students in the fields of reliability engineering, statistical computing, and machine learning.
Autorenporträt
Dr. Hoang Pham is Distinguished Professor and former Chairman (2007-2013) of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey. Before joining Rutgers, he was Senior Engineering Specialist with the Boeing Company and the Idaho National Engineering Laboratory. He has been served as Editor-in-Chief, Editor, Associate Editor, Guest Editor, and Board Member of many journals. He is Editor of Springer Book Series in Reliability Engineering and has served as Conference Chair and Program Chair of over 40 international conferences. He is Author or Co-author of 6 books and has published over 200 journal articles, 100 conference papers, and edited 17 books including Springer Handbook in Engineering Statistics and Handbook in Reliability Engineering. He has delivered over 40 invited keynote and plenary speeches at many international conferences and institutions. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award. He is Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and the Institute of Industrial Engineers (IIE).
