Silicon Microstrip Detectors: Basic Characterization & QA

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A step-wise approach to basic electrical characterization and its quality assurance procedures

ISBN: 3659900044
ISBN 13: 9783659900044
Autor: Ghosh, Pradeep
Verlag: LAP LAMBERT Academic Publishing
Umfang: 124 S.
Erscheinungsdatum: 10.09.2016
Auflage: 1/2016
Format: 0.9 x 22 x 15
Gewicht: 203 g
Produktform: Kartoniert
Einband: Kartoniert
Artikelnummer: 9878939 Kategorie:

Beschreibung

The Silicon Tracking System (STS) is main detector system in the Compressed Baryonic Matter experiment at FAIR and responsible for the reconstruction of the trajectories and momentum of all the charged particles originating from the interaction of heavy-ion beams and fixed target. Up to 1000 charged particles are produced per interaction, at rates up to 10 MHz to enable CBM physics with rare observables. The track reconstruction has to be achieved with 95% efficiency and a momentum resolution 1%. These requirements can be fulfilled with a tracking system of 8 low-mass layers of silicon microstrip sensors located at distances between 30 cm and 100 cm downstream of the target inside the dipole magnetic field. This book describes the characterization procedures for the prototype double-sided silicon microstrip sensors produced for the Silicon Tracking System (STS), the core detector system of the Compressed Baryonic Matter (CBM) Experiment at FAIR. The idea behind this book is to realise and investigate important and significant tests and measurements which have to be performed to characterise and investigate the overall health, operation ability & its noise performance.

Autorenporträt

The author is presently working in Science Administration & Communication at FAIR GmbH. He accomplished his PhD in Physics from Goethe University, Frankfurt Germany. With M.Tech in Nuclear Engineering from Delhi University and Bachelors in Physics, his interests lie in silicon detectors & its quality assurance, nuclear reactors and neutron physics.

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