Beschreibung
Autorenporträt
Stephan Stuerwald studied Physics and Mathematics at the University of Muenster in Germany and the Université Paris Sud 11, prior to completing his diploma thesis at the Center for Biomedical Optics and Photonics at the University Medical Center of Muenster. He then moved to the Fraunhofer Institute in Aachen in 2008, where he was a Research Fellow for 2 years before becoming group leader for optical metrology. He has received a number of awards for his achievements in optics-related research at various optics and metrology conferences and also obtained a research excellence grant from the National Metrology Institute of Germany within the framework of the European Metrology Research Program (EMRP). He also became lecturer at RWTH University in 2009. Since then has lectured on topics including (optical) metrology in general, sensor techniques and data processing and biomedical physics. During his work at the Fraunhofer Institute he prepared his doctoral thesis on optical wave frontmetrology. In 2015 he joined the Optoelectronics Research group as a postdoc at the University of California Berkeley.
Herstellerkennzeichnung:
Springer Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE
E-Mail: juergen.hartmann@springer.com
