Progress in Nano-Electro Optics IV

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Characterization of Nano-Optical Materials and Optical Near-Field Interactions, Springer Series in Optical Sciences 109

ISBN: 3540232362
ISBN 13: 9783540232360
Herausgeber: Motoichi Ohtsu
Verlag: Springer Verlag GmbH
Umfang: xiv, 208 S.
Erscheinungsdatum: 11.02.2005
Produktform: Gebunden/Hardback
Einband: GEB

This volume focuses on the characterization of nano-optical materials and optical-near field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.

Artikelnummer: 1427324 Kategorie:

Beschreibung

InhaltsangabeNear-Field Imaging of Magnetic Domains.- Improvement of Interface Quality in Cleaved-Edge-Overgrowth GaAs Quantum Wires Based on Micro-optical Characterization.- Recombination Dynamics in InxGa1xN-Based Nanostructures.- Quantum Theory of Radiation in Optical Near Field Based on Quantization of Evanescent Electromagnetic Waves Using Detector Mode.

Autorenporträt

InhaltsangabeNear-Field Imaging of Magnetic Domains.- Improvement of Interface Quality in Cleaved-Edge-Overgrowth GaAs Quantum Wires Based on Micro-optical Characterization.- Recombination Dynamics in InxGa1xN-Based Nanostructures.- Quantum Theory of Radiation in Optical Near Field Based on Quantization of Evanescent Electromagnetic Waves Using Detector Mode.

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