Lock-in Thermography

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Basics and Use for Evaluating Electronic Devices and Materials, Springer Series in Advanced Microelectronics 10

ISBN: 3319998242
ISBN 13: 9783319998244
Autor: Breitenstein, Otwin/Warta, Wilhelm/Schubert, Martin C
Verlag: Springer Verlag GmbH
Umfang: xxi, 321 S., 58 s/w Illustr., 68 farbige Illustr., 321 p. 126 illus., 68 illus. in color.
Erscheinungsdatum: 22.01.2019
Auflage: 3/2018
Format: 2.5 x 24 x 16
Gewicht: 661 g
Produktform: Gebunden/Hardback
Einband: GEB

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

Artikelnummer: 5373974 Kategorie:

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