Frequency Measurement and Control

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Advanced Techniques and Future Trends, Topics in Applied Physics 79

ISBN: 3662307960
ISBN 13: 9783662307960
Herausgeber: Andre N Luiten
Verlag: Springer Verlag GmbH
Umfang: xiv, 397 S.
Erscheinungsdatum: 23.08.2014
Auflage: 1/2001
Produktform: Kartoniert
Einband: KT

InhaltsangabeLow-Noise and Ultrastable Secondary Frequency Standards.- Low-Noise Microwave Resonator-Oscillators: Current Status and Future Developments.- Ultrastable Cryogenic Microwave Oscillators.- Frequency-Temperature Compensation Techniques for High-Q Microwave Resonators.- Laser-Cooled Atom and Trapped-Ion Frequency Standards.- Optical Frequency Standards Based on Neutral Atoms and Molecules.- Cold-Atom Clocks on Earth and in Space.- Single-Ion Optical Frequency Standards and Measurement of their Absolute Optical Frequency.- Recent Developments in Microwave Ion Clocks.- Conventional Optical Frequency Measurement and Mid-Infrared Frequency Standards.- Optical Frequency Measurement by Conventional Frequency Multiplication.- Optical Frequency Measurements Relying on a Mid-Infrared Frequency Standard.- Advanced Optical Frequency Measurement and Synthesis.- Measuring the Frequency of Light with Mode-Locked Lasers.- Generation and Metrological Application of Optical Frequency Combs.- Generation of Expanded Optical Frequency Combs.- Accurate Optical-Frequency Synthesis.

Artikelnummer: 7051764 Kategorie:

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