TCP 2010

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160,49 

Proceedings of the 5th International Conference on Trapped Charged Particles and Fundamental Physics (TCP2010) held in Tunturihotelli in Saariselkä, Finland, April 12-16,2010

ISBN: 9400794886
ISBN 13: 9789400794887
Herausgeber: Ari Jokinen/Tommi Eronen/Anu Kankainen et al
Verlag: Springer Verlag GmbH
Umfang: xx, 372 S.
Erscheinungsdatum: 01.03.2014
Auflage: 1/2014
Produktform: Kartoniert
Einband: Kartoniert

TCP 2010 Proceedings of the 5th International Conference on Trapped Charged Particles and Fundamental Physics (TCP2010) held in Tunturihotelli in Saariselkä, Finland, April 12-16, 2010 This volume comprises the recent development in the theoretical and experimental progress dedicated to trapped charged particles and related fundamental physics and applications. The content has been divided topic-wise covering basic questions of Fundamental Physics, Quantum and QED Effects, Plasmas and Collective Behavior and Anti-Hydrogen. More technical issues include Storage Ring Physics, Precision Spectroscopy and Frequency Standards, Highly Charged Ions in Traps, Traps for Radioactive Isotopes and New Techniques and Facilities. An applied aspect of ion trapping is discussed in section devoted to Applications of Particle Trapping including Quantum Information, Chemistry and Trace Analysis. Each topic has a more general introduction, but also more detailed contributions are included. A selection of contributions exemplifies the interdisciplinary nature of the research on trapped charged particles worldwide. Reprinted from Hyperfine Interactions (HYPE) Volumes XXX

Artikelnummer: 6411255 Kategorie:

Beschreibung

This volume comprises the recent development in the theoretical and experimental progress dedicated to trapped charged particles and related fundamental physics and applications. The content has been divided topic-wise covering basic questions of Fundamental Physics, Quantum and QED Effects, Plasmas and Collective Behavior and Anti-Hydrogen. More technical issues include Storage Ring Physics, Precision Spectroscopy and Frequency Standards, Highly Charged Ions in Traps, Traps for Radioactive Isotopes and New Techniques and Facilities. An applied aspect of ion trapping is discussed in section devoted to Applications of Particle Trapping including Quantum Information, Chemistry and Trace Analysis. Each topic has a more general introduction, but also more detailed contributions are included. A selection of contributions exemplifies the interdisciplinary nature of the research on trapped charged particles worldwide. Reprinted from Hyperfine Interactions (HYPE) Volumes XXX

Autorenporträt

Prof. Ari Jokinen Ari.s.a.jokinen@jyu.fi Dr. Tommi Eronen Tommi.o.eronen@jyu.fi Dr. Anu Kankainen Anu.k.kankainen@jyu.fi Prof. Juha Äystö Juha.h.e.aysto@jyu.fi Department of Physics P.O. Box 35 40014 UNIVERSITY OF JYVÄSKYLÄ Finland

Herstellerkennzeichnung:


Springer Verlag GmbH
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69121 Heidelberg
DE

E-Mail: juergen.hartmann@springer.com

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