Multiple Diffraction of X-Rays in Crystals

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53,49 

Springer Series in Solid-State Sciences 50

ISBN: 3642821685
ISBN 13: 9783642821684
Autor: In-Hang, Shih-Lin
Verlag: Springer Verlag GmbH
Umfang: xi, 300 S.
Erscheinungsdatum: 22.12.2011
Auflage: 1/2011
Format: 1.8 x 23.5 x 15.5
Gewicht: 497 g
Produktform: Kartoniert
Einband: Kartoniert
Artikelnummer: 4380936 Kategorie:

Beschreibung

The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg's law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin­ ciple, reflect three-dimensional information about the structure of the dif­ fracting material. Recent progress in understanding this diffraction phenome­ non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys­ tematic review of this type of diffraction, encompasses its diverse applica­ tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.

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E-Mail: juergen.hartmann@springer.com

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