Investigations on rf breakdown phenomenon in high gradient accelerating structures

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Springer Theses

ISBN: 9811079250
ISBN 13: 9789811079252
Autor: Shao, Jiahang
Verlag: Springer Verlag GmbH
Umfang: xiv, 131 S., 18 s/w Illustr., 111 farbige Illustr., 131 p. 129 illus., 111 illus. in color.
Erscheinungsdatum: 26.01.2018
Auflage: 1/2018
Produktform: Gebunden/Hardback
Einband: GEB

This book mainly focuses on the experimental research of rf breakdown and field emission with novel methods, including triggering rf breakdown with high intensity laser and pin-shaped cathodes as well as locating field emitters with a high resolution in-situ imaging system. With these methods, this book has analyzed the power flow between cells during rf breakdown, observed the evolution of field emission during rf conditioning and the dependence of field emission on stored energy, and studied the field emitter distribution and origination. The research findings greatly expand the understanding of rf breakdown and field emission, which will in turn benefit future study into electron sources, particle accelerators, and high gradient rf devices in general. 

Artikelnummer: 3233562 Kategorie:

Beschreibung

Autorenporträt

Jiahang Shao received his Bachelor's degree in Engineering from the Department of Electronic Engineering at Tsinghua University, China in 2011. He obtained his Ph.D. in Engineering from the Department of Engineering Physics at the same university in July 2016, where his major research project in Prof. Huaibi Chen's group was the experimental study of rf breakdown and field emission in high gradient accelerating structures. Currently, he is a postdoctoral appointee working with Prof. Wei Gai at Argonne National Laboratory, USA, continuing his study on field emission and conducting research on wakefield generation by intense electron beam.

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