Defects Analysis Using Ai

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35,90 

ISBN: 3330350504
ISBN 13: 9783330350502
Autor: Bist, Ankur
Verlag: LAP LAMBERT Academic Publishing
Umfang: 52 S.
Erscheinungsdatum: 04.08.2017
Auflage: 1/2017
Format: 0.4 x 22 x 15
Gewicht: 96 g
Produktform: Kartoniert
Einband: Kartoniert
Artikelnummer: 2718038 Kategorie:

Beschreibung

AI and its applications are used every where now a days and our objective is to clarify the significance of same in order to find out defects. There are various features required to analyze the defects and lot of pre-processing also desired. Analysis of metal defects is therefore done and the classification helps to decide the further use of the metal. The various production issues can therefore be resolved if the classification of the metal is done efficiently

Autorenporträt

Prof. Ankur Singh Bist is an assistant professor in KIET Ghaziabad. His area of research is computer virology. He has written more than 100 research papers. He has worked as core member in various conferences of IEEE, Springer etc. He has worked as reviewer/editor in more than 40 conferences held at INDIA, Japan, Malaysia etc.

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