Beschreibung
The work described in this thesis concerns the filling of Single-Walled Carbon Nanotubes (SWNTs) with semiconductor compounds (HgTe, HgxCd1-xTe, InSb, SnSe). Once successfully introduced into the SWNTs, the fillings were structurally analysed via focal series restoration High Resolution Transmission Electron Microscopy (HRTEM). For each system, models were proposed, simulated and compared with original restored phase images.
Autorenporträt
Robin obtained his DPhil in Materials Science from the University of Oxford in 2004. He was then selected as Toshiba Fellow for 2005 and worked at Toshiba Labs, Japan, on nano-materials for next generation storage media. Some of this work has been patented. He now works at Oxford University, commercializing innovative materials technologies.
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