Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat

Lieferzeit: Lieferbar innerhalb 14 Tagen

39,90 

ISBN: 6200092079
ISBN 13: 9786200092076
Autor: Rajput, Rahul Singh
Verlag: LAP LAMBERT Academic Publishing
Umfang: 60 S.
Erscheinungsdatum: 15.06.2019
Auflage: 1/2019
Format: 0.4 x 22 x 15
Gewicht: 107 g
Produktform: Kartoniert
Einband: Kartoniert
Artikelnummer: 7678572 Kategorie:

Beschreibung

The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly.

Autorenporträt

Rahul Singh Rajput currently, working as Assistant Professor at Department of Agriculture, Mandsaur University, Mandsaur, M.P. He received his B.Sc. (Ag) and M.Sc. (Ag) degree specialized in Genetics and Plant Breeding from RVSKVV, Gwalior, M.P. and he also qualified NET (ASRB, ICAR). He has also worked as Senior Research Fellow at IARI, RS Indore

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