Applied Extreme Value Statistics

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160,49 

With a Special Focus on the ACER Method

ISBN: 3031607716
ISBN 13: 9783031607714
Autor: Naess, Arvid
Verlag: Springer Verlag GmbH
Umfang: xiv, 268 S., 92 s/w Illustr., 47 farbige Illustr., 268 p. 139 illus., 47 illus. in color.
Erscheinungsdatum: 15.06.2025
Auflage: 1/2025
Produktform: Kartoniert
Einband: Kartoniert
Artikelnummer: 8561776 Kategorie:

Beschreibung

This book does not focus solely on asymptotic extreme value distributions. In addition to the traditional asymptotic methods, it introduces a data-driven, computer-based method, which provides insights into the exact extreme value distribution inherent in the data, and which avoids asymptotics. It therefore differs from currently available texts on extreme value statistics in one very important aspect.  The method described provides a unique tool for diagnostics, and for efficient and accurate extreme value prediction based on measured or simulated data. It also has straightforward extensions to multivariate extreme value distributions. The first half provides an introduction to extreme value statistics with an emphasis on applications. It includes chapters on classical asymptotic theories and threshold exceedance models, with many illustrative examples. The mathematical level is elementary and, to increase readability, detailed mathematical proofs have been avoided in favour of heuristic arguments. The second half presents in some detail specialized topics that illustrate the power and the limitations of the concepts discussed. With diverse applications to science, engineering and finance, the techniques described in this book will be useful to readers from many different backgrounds.

Autorenporträt

Arvid Naess is Professor of Statistics at the Norwegian University of Science and Technology in Trondheim, Norway. Over many years he has worked on a wide range of problems related to the application of probability and statistics in science and engineering. He is a recipient of the Alfred M. Freudenthal Medal from ASCE, and a Fellow of ASCE, ASME, EMI. He is an elected member of The Royal Norwegian Society (DKNVS) and The Norwegian Academy of Technological Sciences (NTVA).

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